Table of Contents
1- CONCURRENT ENGINEERING
- Why communication is essential
- Why support is critical
- Concurrent Engineering
- Testing Objectives
- Vital cultural philosophy to make testability work in the company
- Who should head a design-build team?
- Logistics
- Efficient use of department resources
- Use experts in the design teams
- Getting product to market
- Design for manufacturing
2- TESTABILITY CONSIDERATIONS
- Test levels are significant cost factors
- Other benefits
- Is testability applicable to your system?
- Responding to arguments why design personnel cannot add testability
- A company should care about testability
- Manufacturing is major source of problems
- Ways to minimize the cost to develop and produce a product
- DFT program implementation
- DFT requires total commitment
- Faults must be isolated
- Evaluate feasibility and effectiveness of testing
- Fixing the manufacturing line and rapid prototypes
- Requirements, resources, and procedures
- Requirements
- Competitiveness
- Causes of operational failures
- Anomalies and their causes
- Check list for manufacturing test engineering (MTE) conditions
- Partition the boards
3- INTEGRATING CAD AND TESTERS
- Saving the software generation
- Integration of design and the factory
- Bareboard test automation
- Motherboard and cable testing automation
- Full ICT abilities
- Robotoic testing
- Functional test automation
4- TESTABILITY GUIDELINES
- Guide scenario
- LRU guides
- Board level guide
- Placement of test points
- Circuit VLSI/LSI guides
- Mechanical guides
- Analog guides
5- TEST METHODS
- Types of testing and advantages and disadvantages
- Component testing methods
- Circuit board test methods
- Kinds of faults at bareboard level
- Testing bareboard using bed of nails (BON)
- Non-contact or single-contact bareboard testing
- Flying Probe
- Flying Probe
- Flying Probe C measurement method
- Testing bareboard with ATE and BONs
- Bareboard test types
- Leakage
- Dendrite
- Additional topics not listed here
6- TESTING SURFACE MOUNT TECHNOLOGY
- Testing SMT - problems and solutions
- The trend to SMT and testing issues
- Circuitry
- Fixturing concerns
- Doing it right at CAE and CAD
- Staggering for simplicity
- Standard cells
- Pads and accuracies
- Cad requirements for better BONs test
- Safety in-clock interruption
- Override of UUT with external control
- Isolate, divide and conquer
- Additional topics not listed here
7- SCAN
Definition of SCAN
- SCAN design advantages and disadvantages
- The SCAN concept
- SCAN F-F definition
- Types of SCAN
- Serial SCAN
- Level sensitive SCAN
- SCAN set
- The combinations of boundary and serial SCAN
- Serial SCAN test sequence
- Random multiplexer SCAN
- Random access SCAN
- Additional topics not listed here
8- TEST STRATEGY
- Strategy consideration
- What is your company's culture?
- Obtaining data
- High volume strategy
- Low volume strategy
- Commercial/military - tey are not created equal
- Economic aspects
- Test strategy scenario
- Field rejects, spares, and ESS
- Rapid prototypes
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